The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 1989

Filed:

Jul. 20, 1987
Applicant:
Inventors:

Misao Morita, Kobe, JP;

Takashi Nakajima, Ashiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356446 ; 3561245 ;
Abstract

The measurement of surface characteristics such as distinctness-of-image glossiness and/or surface roughness of a sample is carried out by projecting an image of a pattern, reflected from the surface of the sample, onto an image forming plane, transforming the spatial distribution of the intensity of light on the image forming plane according to Fourier series, and quantifying the distinctness-of-image glossiness or the surface roughness according to the light power strength at a particular spatial frequency.


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Morita, Misao. (1989). Surface characteristic measurement (U.S. Patent No. 4846578). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4846578

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