The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 1989
Filed:
Oct. 13, 1987
Jerold B Lisson, Henrietta, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
Monitoring alignment of an element(s) is accomplished with a source of radiation (11), an alignment reflecting assembly (12) embedded within or attached to an element (13) whose alignment is to be monitored and a detection assembly (14). Alignment reflecting assembly (12) includes a conventional mirror (16) that reflects a portion of the incident radiation (E) at a reflection angle that is substantially equal in magnitude and opposite in sign to that of the angle at which the incident radiation is incident thereupon. Alignment reflecting assembly (12) also includes a phase conjugate mirror (18) that reflects incident radiation (E) at a reflection angle that is substantially equal in magnitude and sign to that of the angle at which the incident radiation is incident thereupon, i.e., along the path of the incident radiation. The alignment orientation of alignment reflecting assembly (12) and element (13) is determined by monitoring the so-called retro-reflected radiation from the phase conjugate mirror (18) and the reflected radiation from the conventional mirror (16).