The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 1989
Filed:
Jun. 29, 1987
Applicant:
Inventors:
Nicholas C Wislocki, North Royalton, OH (US);
Susan L Fike, Euclid, OH (US);
Assignee:
Picker International, Inc., Cleveland, OH (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G / ;
U.S. Cl.
CPC ...
378 97 ; 378117 ; 378108 ;
Abstract
A system and method for monitoring progress of a radiographic exposure is disclosed. The system samples the cumulative radiation as an exposure progresses, and aborts the exposure if the rate of rise in cumulative radiation is insufficiently low to cause a good exposure. Similarly, the system will terminate an exposure early, at a properly timed out interval, even if the radiation accumulation rises excessively fast due to an erroneous system set up.
Wislocki, Nicholas. (1989). Exposure monitoring in radiation imaging (U.S. Patent No. 4845771). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4845771
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile