The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 1989

Filed:

Nov. 06, 1987
Applicant:
Inventors:

Pulak Bandyopadhyay, Rochester Hills, MI (US);

Dwight A Blaser, Fraser, MI (US);

Brian D Kaminski, Troy, MI (US);

Yong H Lee, Troy, MI (US);

Assignee:

General Motors Corporation, Detroit, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ; G06K / ;
U.S. Cl.
CPC ...
382-8 ; 358101 ; 358106 ;
Abstract

The disclosure reveals a computer vision technique to measure flank and crater wear of a single point cutting tool. This direct tool wear measurement method uses a microscope mounted camera to acquire an image of the tool. Special lighting of a face of the tool shows contrast of the wear region in the image. The image analysis is based on an interactive procedure utilizing a general purpose image processing system. A computer program calculates ten parameters to characterize flank and crater wear.


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