The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 1989
Filed:
Dec. 07, 1987
Applicant:
Inventors:
Hiroyuki Sakai, Tokyo, JP;
Yoshiyuki Asahara, Tokyo, JP;
Shigeaki Omi, Saitama, JP;
Shin Nakayama, Tokyo, JP;
Yoshitaka Yoneda, Tokyo, JP;
Assignee:
Hoya Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C03B / ; C03B / ;
U.S. Cl.
CPC ...
65-311 ; 65 3013 ; 65116 ;
Abstract
The refractive index distribution in refractive index distribution lenses may be adjusted to better approach an ideal by heating the refractive index distribution lens. When the refractive index distribution lens was created by diffusion of refractive index changing ions into a body, further heating in an environment in which no additional ions can diffuse into the body causes further migration of ions within the body so that its refractive index distribution approaches an ideal.