The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 1989
Filed:
Feb. 29, 1988
Yoshiyuki Asahara, Tokyo, JP;
Hiroyuki Sasai, Tokyo, JP;
Shigeaki Omi, Saitama, JP;
Seiichi Shingaki, Tokyo, JP;
Shin Nakayama, Tokyo, JP;
Hoya Corporation, Tokyo, JP;
Abstract
Refractive index distribution lenses may be made by forming refractive index distribution patterns in surfaces of two substrates. The patterns in the two substrates are made to be matching. Then, these surfaces of the two substrates are placed together with the patterns in the substrates coinciding. If the refractive index distribution patterns in the surfaces form semicylindrical lenses with parallel axes, the substrates may be put together so that the axes of the lenses in one substrate coincide with corresponding axes of semicylindrical lenses in the other substrate to form a rod lens array. If the refractive index distribution patterns in the two substrates are constant in directions parallel to the surfaces of these substrates but vary in the direction perpendicular to the surfaces, the surfaces of these substrates may be put together to form a slab lens.