The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 1989

Filed:

Dec. 18, 1987
Applicant:
Inventor:

Katushige Nakamura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250201 ; 356-4 ;
Abstract

Method and apparatus, employing a polarized He-Ne laser beam as a measuring beam, for changing the angle of incidence of the measuring beam upon an object in connection with a system capable of performing precision automatic focusing of the measuring beam upon the object in a noncontacting manner whether upon the surface of a transparent body or upon the surface of an opaque substance.


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