The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 1989
Filed:
Apr. 20, 1987
Applicant:
Inventors:
Donald L Plumton, Dallas, TX (US);
Shiban K Tiku, Camarillo, CA (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
437161 ; 437160 ; 437162 ; 437178 ; 437184 ; 437200 ; 437 32 ; 437 39 ; 437 45 ; 437911 ; 437173 ; 148D / ; 148D / ; 148D / ; 148D / ; 357 22 ; 357 35 ; 357 67 ;
Abstract
A method of diffusion of dopants (e.g. zinc) into III-V substrates (e.g. GaAs) using metal silicide and dopants (e.g. W.sub.x Si.sub.y :Zn) is disclosed. A cap layer (e.g. SiO.sub.2 or Si.sub.3 N.sub.4) is also used. The zinc tungsten silicide is formed by cosputtering zinc and tungsten silicide (W.sub.5 Si.sub.3). Applications include adjustment of threshold voltages in JFETs by rapid thermal pulsing of zinc into device channel regions and use of the zinc tungsten silicide as a base contact plus extrinsic base dopant source together with a nitride sidewall self-alignment.