The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 1989
Filed:
Jul. 30, 1987
Yasuhiko Noguchi, Machida, JP;
Masahiro Naito, Kanagawa, JP;
Kenji Morinaga, Machida, JP;
Yohji Takahashi, Sagamihara, JP;
Katsuo Mitani, Fujisawa, JP;
Shino-Test Laboratory Inc., Kanagawa, JP;
Tokuyama Soda Co. Ltd., Yamaguchi, JP;
Abstract
An immunological assay method, wherein the concentration of a substance to be assayed is calculated from a calibration curve, which is formed in the preparation of a reagent or in the assay of a sample based on parameter(s) determined in the preparation of the reagent, without the need of forming any additional calibration curve each time, is disclosed. By the immunological assay method of the present invention, the concentration of the substance to be assayed can be efficiently and discontinuously determined, when compared with conventional ones. The method of the present invention is particularly suitable for quantitatively determining an antigen or an antibody.