The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 1989

Filed:

Jan. 15, 1988
Applicant:
Inventor:

Kenneth P VonBargen, Berwyn Heights, MD (US);

Assignee:

Pacific Scientific Company, Newport Beach, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356336 ; 356338 ; 356341 ;
Abstract

In an optical instrument for measuring particles in the size range of 0.5 microns to 300 microns, a laser beam is caused to pass through a sample stream of liquid containing particles to be measured. A photodetector detects a portion of the direct laser beam passing through the sample stream and the amplitudes of the pulses generated by this first photodetector provide a measurement of particles in the size range of 10 to 50 microns. A second photodetector detects forward scattered light from the laser beam passing through the liquid sample stream. The amplitudes of pulses generated by the second photodetector provide a measurement of pulses in the size range of 0.5 microns to 10 microns and the durations of pulses generated by the second photodetector provide a measurement of pulses in the size range of 50 to 300 microns.


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