The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 1989
Filed:
Apr. 21, 1988
Kenhachi Mitsuhashi, Hiratsuka, JP;
Yoshinobu Ohashi, Hiratsuka, JP;
Shohei Nakayama, Odawara, JP;
Akira Yamada, Tokyo, JP;
The Yokohama Rubber Co., Ltd., Tokyo, JP;
Abstract
A tension tester in which a specimen marked with at least one measuring marking whose optical characteristic is different from that of the specimen's ground color is held by chucks at the ends and subjected to a tensile load by moving one of the chucks; in which, while the specimen is being stretched, the marking is scanned by a scanner to detect a positional change of the marking in the tensile direction; and in which electric signals which are produced due to the difference in the optical characteristic between the marking and the specimen's ground color are processed to determine the tensile characteristic of the specimen. In this tension tester, the scanner consists of a first scanner with its field of view set to the entire elongation range of the specimen; and at least one second scanner having its field of view set only to a low elongation range of the specimen, the second scanner either having a greater number of elements than the first scanner or being adapted to perform a magnified scanning with greater magnification than that of the first scanner.