The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 1989
Filed:
Apr. 27, 1987
James K Mathewes, Jr, Northborough, MA (US);
Jan S Hermam, Holliston, MA (US);
Stephen C Johnson, Waltham, MA (US);
Richard B Goud, Concord, MA (US);
Jack J Stiffler, Hopkinton, MA (US);
Raytheon Company, Lexington, MA (US);
Abstract
A microprogrammed control unit of an information processing system having a control sequencer with dual microprogram counters for performing microdiagnostics simultaneously with performing macroprograms. The microdiagnostics comprise background and operability tests, the background tests being interleaved with macroinstruction operations under the control of the two independent microprogam counters. The background tests are run during processor idle time and the operability tests are executed at processor turn-on. The organization of the microdiagnostics into a hierarchical structure allows the use of the same microprogrammed test module for both the background and operability microdiagnostic tests. A prediction/residual coding technique provides fault detection for address and data information within the control sequencer.