The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 1989

Filed:

Jun. 18, 1987
Applicant:
Inventors:

Akio Wada, Hachioji, JP;

Fumiko Nakeuchi, Kokubunji, JP;

Seiji Nishizawa, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ; G01N / ;
U.S. Cl.
CPC ...
250304 ; 250341 ; 356 36 ; 356244 ;
Abstract

A method of analyzing a sample solution comprises the steps of allowing the sample solution to drip onto a sample retaining means, depositing a solute of the sample solution by evaporating a solvent thereof, irradiating infrared radiation onto this solute, and measuring the intensity of the infrared radiation which is reflected by the solute and the sample retaining means disposed under the solute so as to obtained an infrared spectrum. An apparatus for preparing a sample solution is provided for carrying out the above-described method. In this apparatus, the sample retaining means is moved so that a layer of solute which corresponds to each droplet of sample solution is continuously formed on the sample retaining means.


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