The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 1989
Filed:
Jun. 15, 1987
Battelle-Institut e.V., Frankfurt am Main, DE;
Abstract
A method for testing components of transparent material for surface irregularities and occlusions, comprising the steps of dot-scanning the component by moving a light ray completely therethrough; detecting the light which represents flaws in at least the front and back surfaces of the component by receivers located on one side of the component; generating fault signals based on the light detected in the detecting step; digitizing the fault signals which are generated in the generating step; feeding the digitized signal to a mapped memory; and analyzing the signal by: (a) feeding the digitized signal to a number of sector counters via a preselectable number of thresholds; (b) evaluating the sector counters on-line according to preselected criterion regarding the number, location and gray tone distribution of the digitized fault signals; and (c) evaluating the signals in the mapped memory in a computer if the fulfillment of the criterion for evaluation of the sector counters cannot be sufficiently assured.