The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 1989

Filed:

Dec. 19, 1986
Applicant:
Inventors:

Takao Tawara, Kawaguchi, JP;

Jun Akedo, Tokyo, JP;

Yoshiyuki Iwashita, Tokyo, JP;

Assignee:

Opticon Inc., Orangeburg, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
235472 ; 235454 ; 235462 ; 235463 ; 235467 ;
Abstract

A scanning device for reading bar codes symbols comprising at least two moveable, preferably rotatably driven, reflective surfaces, such as mirrors, which direct a light source, preferably from a laser, in a scanning pattern towards the object to be scanned. At least one of said reflective surfaces having an associated lens means to modify the light beam associated with its reflective surface, and means adapted to move each of said reflective surfaces and the associated lens into a path adapted to intersect with said beam of light. Means are provided to direct the beam of light outside the scanning device as a sweep beam onto the bar code symbol to be read and optical means and sensing means are provided to collect the light reflected from the bar code symbol and generate data therefrom.


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