The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 1989
Filed:
Sep. 09, 1987
Yukio Kano, Aichi, JP;
Kuniyuki Yoshikawa, Aichi, JP;
Hideaki Kishida, Aichi, JP;
Hiroshi Ito, Aichi, JP;
Mitsutoshi Maeda, Aichi, JP;
Kabushiki Kaisha Tokai Rika Denki Seisakusho, Aichi, JP;
Kabushiki Kaisha Toyota Chuo Kenkyusho, Aichi, JP;
Abstract
A method of and an apparatus for measuring the coordinates of each edge of a tape is disclosed. The method comprises the steps of attaching a tape to a surface of an object, such as a three-dimensional subject, to be measured in such a manner that at least one edge of the tape is placed along a measurement line, such as an edge, on the surface, the tape and the surface differing from each other in reflectance; projecting a deflected spot beam onto the area of the surface of the object including the edges of the tape; and detecting the portion of the area the reflectance of which sharply varies, thereby calculating the two-dimensional coordinates of the thus-detected values. Accordingly, it is possible to accurately measure the three-dimensional configuration along the measurement line.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile