The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 1989

Filed:

Apr. 12, 1988
Applicant:
Inventors:

Eric L Buckland, Raleigh, NC (US);

Masayuki Nishimura, Durham, NC (US);

Assignee:

Sumitomo Electric Fiber Optics Corporation, Research Triangle Park, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356 731 ;
Abstract

A simultaneous bi-directional OTDR optical fiber measurement method wherein a test fiber is spliced between a launch fiber and a termination fiber which is provided with a reflective coating at its terminal end. A laser light pulse is introduced into the launch fiber and the forward trace signal and reverse trace signal from the light pulse are detected. A correction is applied to the reverse trace signal to account for reflectivity originating at the fiber input end so that an accurate measurement can be made of certain fiber characteristics of a single-mode optical fiber.


Find Patent Forward Citations

Buckland, Eric. (1989). Simultaneous bi-directional optical time domain reflectometry method (U.S. Patent No. 4838690). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4838690

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…