The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 1989
Filed:
May. 18, 1987
Tadashi Ichihashi, Hino, JP;
Masunori Kawamura, Hino, JP;
Kowa Company Ltd., Aichi, JP;
Abstract
An ophthalmic measuring method and apparatus according to the present invention are provided for the purpose of measuring the state of microparticles in the aqueous chamber of an eye to be examined which is irradiated with a laser beam to detect the scattering characteristics in the aqueous chamber of the eye. A laser beam with a predetermined wavelength is projected into the aqueous chamber of the eye. Light scattered from the aqueous chamber is received with or without a linear polarizer and evaluated in terms of the changes between the scattering characteristics with or without the linear polarizer in order to measure the number or concentration of the microparticles present in the aqueous chamber for the purpose of detecting ophthalmic diseases.