The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 1989
Filed:
May. 06, 1988
Bala S Manian, Saratoga, CA (US);
Lumisys Inc., Sunnyvale, CA (US);
Abstract
A beam scanning system having a beam reflecting element, such as a mirror, disposed in the path of an incident beam defining an optical axis, which is pivotable about two perpendicular axes so as to provide for scanning a reflected beam in two dimensions. A pivot axis is perpendicular to the optical axis and may be provided by a spindle supporting a galvanometer mirror. The second axis coincides with the optical axis and may be provided by a meter driven shaft attached to the mirror support which is rotatable about the optical axis. The reflecting element reflects the beam toward an image plane that is parallel to the incident beam so as to scan a sequence of parallel lines without pincushion errors. An optical f-.theta. correcting lens may be provided in the reflected beam path to correct for tangential spacing errors in the image plane.