The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 1989
Filed:
Jan. 27, 1987
Tanakon Ungpiyakul, Neenah, WI (US);
Arch D Morgan, Neenah, WI (US);
Thomas Douglas C, Neenah, WI (US);
Timothy J Ketenhofen, Appleton, WI (US);
Douglas J Marver, Mosinee, WI (US);
Laurie Couture-Dorschner, Hortonville, WI (US);
William S Pomplun, Neenah, WI (US);
Kimberly-Clark Corporation, Neenah, WI (US);
Abstract
The present invention provides an apparatus for examining a moving web composed of an interconnected plurality of articles to determine a location of a selected component thereof. The apparatus includes an indicating mechanism for providing marker data corresponding to the presence of a selected article. A metering mechanism generates gauge data corresponding to selected incremental lengths along the article in the movement direction of the web. A designating mechanism provides reference data corresponding to a selected reference point on the article, and a locating mechanism detects position data corresponding to a position of a selected component of the article. An evaluating mechanism processes the reference data, location data and gauge data to determine a spaced distance between the component and the reference point. A comparator mechanism determines a difference between the spaced distance and a predetermined acceptance spacing range, and a culling mechanism designates selected articles for which the spaced distance is outside of the acceptance spacing range.