The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 1989

Filed:

Dec. 21, 1987
Applicant:
Inventors:

Richard F Herlein, San Jose, CA (US);

Jeffrey A Davis, Santa Clara, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K / ; G06K / ;
U.S. Cl.
CPC ...
328 72 ; 328 55 ; 307269 ; 307590 ; 371-1 ;
Abstract

A system is disclosed which enables signals to be supplied at precisely desired times in an automatic test system. The apparatus includes a base delay memory which stores information representing the higher order bits of a time delay, while vernier memories store information relating to the lower order bits of the time delay. Offset memories enable storing calibration data. The base delay memory controls at least two counters in independent signal paths, while the vernier and offset memories control appropriate deskew units for further delaying the counter output signal as desired. The system enables sharing of resources, yet eliminates the need for repetitively loading correction data for deskew operations.


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