The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 1989
Filed:
Jan. 20, 1988
Bengt H Tornblom, Vasteras, SE;
Abstract
Defect detecting equipment includes a device which detects the presence of, for example, disturbing magnetic material such as cold oxide scales in a test object, in order thus to control, for example, that disturbances of a magnetic origin are not confused with surface cracks without being discovered. By utilizing eddy current techniques, phenomena which are harmless to the process can be separated from dangerous surface cracks, thus avoiding the scrapping of crack-free test objects. The invention is based on signal-processing at least two signals, for example H1 and L1, originating from a test object sensing tansducer, by means of a vector transformation method, and distinguished between harmful and harmless phenomena (e.g. cracks and oxide scales) as a function of a comparison of signals, S1 and S2l , from at least two transformation blocks.