The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 1989
Filed:
Oct. 26, 1987
Charles D Hechtman, Plainsboro, NJ (US);
American Telephone and Telegraph Company AT&T Technologies, Inc., Berkeley Heights, NJ (US);
Abstract
A high frequency test fixture (40) comprises an array of Euler column probes (57,58,59) positioned between a circuit board or substrate under test (41) and a routing board or substrate (42) connected to an electronic tester. The Euler column probes are held in a compliant conducting medium (53) interposed between the circuit under test and the routing board. Electrical insulation (67,68) is placed around each alternate probe of the array of probes to isolate it from the compliant conducting medium. Such an alternate probe is to be used as a test signal driving probe. The probes adjacent to and surrounding a test signal driving probe are in electrical contact with the compliant medium and are to be used as ground probes. A high frequency test signal applied to the circuit under test via one of the alternate probes follows a return current path along the outside perimeter of the compliant medium thereby substantially reducing noise and effective lead inductance of the test fixture (FIG. 2).