The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 1989
Filed:
Aug. 25, 1988
Ichiro Katayama, Tokyo, JP;
Union Tool Co., Ltd., Tokyo, JP;
Abstract
There is disclosed an optical measuring apparatus including a light scanning section for converting a light beam from a first light source to a parallel scanning light beam, a focussing section including a first focussing lens for focussing the parallel scanning light beam, an electric signal generating section for converting a focussed light to an electric signal, a measuring reference signal generating section and an electric signal processing section. The light scanning light section comprises a first mirror and a second mirror, each of which is rotated synchronously. The measuring reference comprises a transparent scale which is rotated in synchronism with the first and second mirrors, a light source, a second focussing lens and a second photoelectric conversion element. The electric signal processing section processes the electric signal from the electric signal generating section based on the measuring reference signal.