The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 1989
Filed:
Dec. 29, 1986
Byoung Y Kim, Stanford, CA (US);
Herbert J Shaw, Stanford, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Abstract
A system and method for detecting the influence of selected forces on an interferometer over an extended dynamic range. One presently preferred embodiment is disclosed for detecting rotation of an interferometer. In this embodiment, an open-loop, all-fiber-optic gyroscope provides an output signal comprising the phase difference of two light waves which are counterpropagating within the gyroscope, and which are phase modulated at a selected frequency. The phase difference of the light waves is influenced by the rotation rate of the interferometer. The output signal is amplitude modulated at the phase modulation frequency to transpose the optical phase shift into a low frequency electronic phase shift, which is measured using a digital time interval counter. A linear scale factor is achieved through use of this system and method.