The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 1989
Filed:
Jun. 16, 1988
Carl Schenck AG, Darmstadt, DE;
Abstract
In a method and apparatus for measuring deformations of test samples in testing machines, a test sample (4) is clamped into force transmitting units (10, 11). A light source (1) emits a light beam (2) which is reflected from at least one mirror (6, 6') arranged on the force transmitting units (10, 11) to impinge upon a position detector (7) which generates an output signal. The output signal is input to an electronic evaluating circuit (8) to determine the location or rather the location movement of the point of impingement of the light beam on the position detector. Preferably, but not necessarily, each force transmitting unit (10, 11) includes its own mirror (6, 6'), whereby the light beam (2) emitted by the light source (1) is reflected in sequence by the first mirror (6) of the first force transmitting unit (10) onto a second mirror (6') of the second force transmitting unit (11) and then onto the position detector (7). These steps and elements measure a test sample deformation and/or a deformation velocity with a high accuracy and in a simple manner, especially in fast tensile rupture testing machines.