The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 1989

Filed:

Nov. 24, 1986
Applicant:
Inventors:

Jorge O Parra, Helotes, TX (US);

Thomas E Owen, Helotes, TX (US);

Bob M Duff, San Antonio, TX (US);

Assignee:

Southwest Research Institute, San Antonio, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
324363 ; 324357 ;
Abstract

A method and apparatus for collecting measurements on the surface of the earth in a form which can be processed to obtain enhanced resolution of subsurface resistivity anomalies in the earth's geologic structure. The system of the preferred embodiment utilizes many separately acquired voltage and current measurements on the earth's surface in a superposition analysis to 'synthesize' the condition whereby the many separate measurements are acquired simultaneously to give useful advantages in improved depth of investigation commonly known as focused resistivity measurements.


Find Patent Forward Citations

Loading…