The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 1989
Filed:
Dec. 23, 1985
Daniel B Seymour, Chino, CA (US);
Paul E Theobald, Fullerton, CA (US);
John E Lillig, Diamond Bar, CA (US);
Beckman Instruments, Inc., Fullerton, CA (US);
Abstract
The peak verify time for kinetic nephelometric measurements of reactions between antigens and antibodies is adjusted as a function of the magnitude of the peak rate order to reduce the time required for peak verification. The scatter signal is zeroed following the end of the peak verification period and the reaction is tested for antigen excess. Reactions during the antigen excess check having rates that exceed a threshold value are accepted as being valid, and no additional measurements are made for such samples. Reactions during the antigen excess check having rates that are less than the threshold value are rejected as being in antigen excess. Samples found to be in antigen excess are diluted and then reanalyzed.