The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 1989
Filed:
Sep. 22, 1987
Applicant:
Inventor:
Katsuhiko Kobayashi, Tokyo, JP;
Assignee:
Tokyo Kogaku Kikai Kabushiki Kaisha, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351208 ;
Abstract
A working distance alignment optical system for use in an ophthalmological instrument includes a target projecting optical system for projecting a target to a cornea of an eye to be tested, and a target image observing optical system for observing an image of the target in the cornea from the diagonal direction with respect to the target projecting optical system. The working distance alignment optical system is characterized in that at least one of the target projecting optical system and the target image observing optical system is provided with an optical element whose optical working surface is a toric surface.