The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 1989

Filed:

Dec. 01, 1987
Applicant:
Inventors:

Kazuo Kajitani, Ina, JP;

Chikara Nagano, Hachiouji, JP;

Makoto Shigehara, Hachiouji, JP;

Kazuhiko Osa, Hachiouji, JP;

Eisuke Arinobe, Ina, JP;

Hideto Yamashita, Ina, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350502 ; 350508 ; 350511 ; 350519 ; 350520 ;
Abstract

A microscope apparatus manufacturable at a low cost, and equipped with a photographing device assuring coincidence between an image to be observed and an image to be photographed, correctly photographing the up-down and right-left directions of a sample with no switching operation and permitting correct readout of characters, etc. written on a sample, a macro observation or drawing attachment permitting observation of the entire surface of a sample even of a large size without fail, not degrading operability of the microscope and having a composition to facilitate correction of image rotation, and a data imprinting device providing legible imprinted data images and capable of shifting data imprinting position on the film surface of the photographing device.


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