The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 1989
Filed:
Mar. 22, 1988
Mitsuo Isobe, Yokohama, JP;
Tohru Kimura, Sagamihara, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
A defect detection circuit for detecting a defect of a memory cell, a counter for counting defects detected by the defect detect circuit, and a remediableness determination unit for determining whether a count of the counter allows remedy by a redundancy circuit, are provided in a tester for a semiconductor memory or on a memory chip having a redundancy circuit. When the count of the counter is the same as or smaller than the number of at least one of the auxiliary rows and columns of the redundancy circuit, the memory is determined to be 'remediable.' Otherwise, the memory is determined to be 'unremediable.' When the count of the counter exceeds the number of at least one of the auxiliary rows and columns of the redundancy circuit, the memory test is interrupted.