The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 1989

Filed:

Jul. 19, 1988
Applicant:
Inventors:

Etsuji Yamamoto, Akishima, JP;

Takashi Onodera, Koganei, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324309 ; 324307 ;
Abstract

In an NMR imaging method of distinguishing two chemical shifts of unclear spins and obtaining respective spin distribution images, 180.degree. RF. pulses are applied twice to generate two spin echoes after spins of an object for inspection have been exicted. In the second echo among them, a pulse time-interval is so set that the time difference between the Hahn echo and the gradient echo may provide two chemical shifts with a phase difference of 2n.pi.. On the basis of information representing the distribution of a static magnetic field included in an image obtained from the second pulse, an image obtained from the first echo is compensated. By using the compensated image, spin distribution images with two chemical shifts distinguished are obtained.


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Yamamoto, Etsuji. (1989). Nmr chemical shift imaging method with influence of intensity (U.S. Patent No. 4833408). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4833408

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