The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 1989
Filed:
Jun. 06, 1986
David L Gibbs, New York, NY (US);
Other;
Abstract
In a method for visually inspecting a sample through an objective lens of a microscope, a slide carrier attached to the microscope stage is automatically shiftable relative to a frame and to the stage along a predetermined meander path. A microscope slide and the slide carrier are provided with cooperating elements for positioning the slide at a predetermined position and orientation with respect to the carrier. The slide is further provided with a reference mark for enabling an automatic monitoring of the position of the slide relative to the frame of the carrier during an inspection of the slide. The x and y coordinates relative to the slide carrier frame of a detected microscopic object are recorded. On a later occasion, the detected object can be easily relocated by fixing the slide to the carrier in the predetermined fixed position and orientation, shifting the slide carrier so that the reference mark appears in the visual field of the microscope being used, setting this position of the slide as a reference position, and moving the slide as well as the slide carrier from that reference position in accordance with the previously recorded x and y coordinates.