The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 1989

Filed:

Mar. 14, 1988
Applicant:
Inventors:

Robert J Valenta, Berkeley, IL (US);

John E Noakes, Athens, GA (US);

Assignee:

Packard Instrument Company, Inc., Downers Groove, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
250362 ; 250364 ; 250366 ; 250367 ; 250369 ;
Abstract

A low-level liquid scintillation measurement system for counting sample optical events resulting from the radioactive decay of a constituent of a sample to be measured while reducing the counting of background optical events which are optical events produced by background radiation and which create electrical pulses other than pulses representing a sample optical event. This system includes detection means located adjacent the sample for detecting optical events and for converting optical events into electrical pulses, coincidence sensing means for receiving the electrical pulses from the detection means and producing a trigger pulse when the electrical pulses from the detection means coincide with each other, burst detection means for receiving the trigger pulses from the coincidence sensing means and the electrical pulses from the detection means for determining the number of electrical pulses present in a selected interval following each of the trigger pulses, evaluation means connected to the burst detection means for determining, in response to the number of pulses detected in the selected interval, the extent to which the optical event represented by the corresponding trigger pulse should be treated as a sample optical event or a background event, and an active guard shiled arrangement comprising an auxiliary scintillator optically coupled to the detection means. The shield is adapted to be excited by background radiation and to effectively increase the number of electrical pulses present in the selected interval following a trigger pulse generated as a result of the coincident pulses produced due to the background radiation. This allows the measurement system to accurately evaluate the number of pulses detected in the selected interval and determine the extent to which a trigger pulse is to be treated as a sample optical event.


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