The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 1989
Filed:
Oct. 09, 1987
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
A simple inspection device is constituted for inspection of an analyzer for measuring ionic activity by using an ionic activity measuring device provided with at least one ion selective electrode pair for generating an electrical potential corresponding to ionic activity of a predetermined ion, and a porous bridge for associating the electrodes of the ion selective electrode pair with each other, and by contacting potential difference measuring probes respectively with the electrodes of the ion selective electrode pair, to thereby measure a difference in potential between the electrodes. The simple inspection device employs a supporting member having outer dimensions approximately equal to the outer dimensions of the ionic activity measuring device, and an electrically conductive member supported on the supporting member for short-circuiting across the potential difference measuring probes when the potential difference measuring probes are contacted with the electrically conductive member.