The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 1989

Filed:

May. 16, 1988
Applicant:
Inventors:

Minoru Sasabe, Chiba, JP;

Nobuo Hamada, Ichikawa, JP;

Toshio Nagatsuka, Ichikawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
204412 ; 204422 ; 436145 ;
Abstract

A probe for measuring the concentration of an impurity in molten iron is disclosed. The probe comprises three sensors. The first sensor measures the activity of the impurity element directly. The second sensor measures the activity of free oxygen. The third sensor measures carbon content. These values are used are used to give a compensated measure of the impurity element.


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