The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 1989
Filed:
Jul. 09, 1987
Muneharu Ishikawa, Tama, JP;
Kouichi Akiyama, Hino, JP;
Eiichi Ito, Toyohashi, JP;
Masunori Kawamura, Hino, JP;
Akihiro Fujita, Hino, JP;
Kowa Company Ltd., Aichi, JP;
Abstract
Disclosed is a method and apparatus for measuring particles in a fluid by irradiating the fluid containing the particle with a laser beam and analyzing the laser light scattered by the particle to determine the characteristics of the particle. An elliptical laser beam is projected into a particle detection area in which the particles to be measured are caused to flow. The laser light scattered by the particle is received for photoelectric conversion into a time-series photoelectric signal in a direction along which the particle flows. The photoelectric signal is subjected to a moving average process to determine a time width during which the signal exceeds a predetermined level to cause the change in intensity of the scattered light. This change is recognized as a change in intensity caused by the passage of the particle through the particle detection area when the time width falls within a certain range.