The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 1989
Filed:
Oct. 29, 1987
Robert Giebeler, Cupertino, CA (US);
Beckman Instruments, Inc., Fullerton, CA (US);
Abstract
A centrifuge sample is optically scanned during centrifuging. The sample, placed in a centrifuge rotor having a cell with top and bottom windows, is spun until stratification and discrete layering occurs within the sample. Such layering occurs on layers that are precisely normal to the radius of the centrifuge at the point of sample and parallel to the spin axis of the centrifuge. A slit scanner having a slit normal to the sample plane transverse the width of the sample below the cell to detect with precision the precise location of the strata in the cell. A light source is reflected by a toroidal mirror having two radius of curvature. One radius of curvature is selected to collimate rays of light parallel to the layer of the sample. The mirror is ruled with respect to the other radius of curvature to chromatically classify light to preselect band width. Rotation of the mirror preserved collimation but enables selected scanning light frequency.