The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 1989
Filed:
Feb. 04, 1985
Joel Hecker, Port Jefferson, NY (US);
Howard Stern, Greenlawn, NY (US);
Tom Heydenburg, Upper Saddle River, NJ (US);
Robotic Vision Systems, Inc., Hauppauge, NY (US);
Abstract
A three-dimensional optical measurement system, where it is desired to move the light beam or plane to more than one position to increase the amount of data acquired. A rotating disk is provided with segments of lenses, zone plates or other rotationally invariant grating patterns on it. The beam or plane is passed through the segments as the disk rotates and is deflected to predetermined angles. The accurate repeatability of this arrangement allows the use of calibration data and encoding of the light planes for ambiguity resolution to provide an accurate measurement system. Diverging beam light sources are readily accommodated. Similarly translating frames with segments of translationally invariant lenses or grating patterns may be used. Two-dimensional holographic gratings may be used to generate raster scans.