The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 1989

Filed:

May. 11, 1987
Applicant:
Inventors:

James D Aid, St. Petersburg, FL (US);

Norman F Cameron, St. Petersburg, FL (US);

Thomas P Hartranft, Safety Harbor, FL (US);

Assignee:

Baxter International Inc., Deerfield, IL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F / ; G01P / ;
U.S. Cl.
CPC ...
364510 ; 36441307 ; 340606 ; 73195 ; 128637 ;
Abstract

A flow rate measurement system and method suitable for monitoring filtrate flow in a hemodialysis apparatus, provides a pair of flow meters in series at the input of a dialyzer for producing electrical signals indicative of dialysate flow rate and a pair of flow meters in series at the output of the dialyzer for producing electrical signals indicative of dialysate plus filtrate flow rate. A computer receives the flow rate signals and is programmed to calibrate each flow meter during a calibration phase to correct for any variations in each pair to thereby produce corrective scale factors. During an operational phase of the apparatus, the program monitors the flow meters and provides an alarm if any changes between the readings of either of the pairs of flow meters occurs.

Published as:
JPS63308519A; EP0298587A2; US4827430A; EP0298587A3; CA1318151C; EP0298587B1; DE3850178D1; ES2056923T3; DE3850178T2; JP2779500B2;

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