The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 1989
Filed:
Feb. 12, 1987
Membrain Limited, Wimborne, GB;
Abstract
In circuit testers, notably automatic test equipment for the in circuit testing of digital devices, overheating damage can result if outputs are repeatedly 'overdriven', that is, while applying a test input to a first device, an output of a second connected device is forced into a state contrary to that it would normally adopt. Damage is avoided by enforcing a cooling interval between overdriving tests based upon a list of parameters representative of the overdriven device and its environment. In order to reduce the overall test time, a parameter is based on a measurement derived from a circuit of the type under test. A first test results in device heating to a value. A cooling interval is enforced so that a subsequent test which results in further heating of the device, may be made without exceeding device maximum allowable temperature .sup.T max.