The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 1989

Filed:

May. 07, 1987
Applicant:
Inventors:

Roger E Smith, Bountiful, UT (US);

Randall W Smith, Sandy, UT (US);

Assignee:

Becton, Dickinson and Company, Franklin Lakes, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
422 68 ; 356246 ; 356419 ; 356440 ; 422 64 ; 422 65 ;
Abstract

A detector assembly for use with an analyzer instrument comprises a light source for providing a light beam for analyzing one or more substances in a sample. A detector is included for detecting light associated with the sample under analysis. An analysis station permits the light beam to enter the sample and shields the sample from extraneous light. The analysis station further permits light to pass from the sample to the light detector. A plurality of filters is selectively positionable in the light beam between the light source and the sample. These filters permit different wavelengths of light to pass therethrough so that selective light analysis of the sample may be performed.


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