The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 1989
Filed:
Nov. 30, 1987
Randolph L Hall, Newbury Park, CA (US);
Frank J Woodberry, Malibu, CA (US);
William H Southwell, Thousand Oaks, CA (US);
Rockwell International Corporation, El Segundo, CA (US);
Abstract
A gradient index filter can be fabricated with integral antireflection properties without degrading the inband performance of the filter. The filter is for placement between an incident medium and a substrate to reflect incident electromagnetic energy having wavelengths within a predetermined band of wavelengths and to transmit incident electromagnetic energy having wavelengths outside of the reflection band. The filter includes an antireflecting portion having a nominal refractive index profile selected to reflect a minimum amount of electromagnetic energy from a theoretical interface between a first medium having a first predetermined refractive index and a second medium having a second predetermined refractive index. A band rejecting portion has a periodic refractive index profile whose periodicity and amplitude are selected to reflect a maximum amount of electromagnetic energy within the relfection band. At least part of the nominal refractive index profile is modulated by the superposition thereon of at least part of the periodic refractive index profile. The entire periodic refractive index profile maybe superimposed on the monial refractive index profile, while the periodic refractive index profile may be a rugate profile. In addition, the nominal incident and substrate refractive index profiles may be quintic refractive index profiles.