The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 1989

Filed:

Apr. 22, 1987
Applicant:
Inventor:

Takushi Nishiya, Machida, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G06F / ;
U.S. Cl.
CPC ...
364560 ; 250561 ; 356363 ; 358107 ; 364516 ; 364525 ; 382 23 ;
Abstract

Points on a pair of images obtained by imaging an object are finely corresponded in order to precisely measure the three-dimensional position of the object. For this purpose, attractive forces corresponding to features of the images are calculated, and the degree of correspondence between the points on the pair of images is evaluated relying upon the magnitude of the attractive force, in order to determine the corresponding points and to calculate the position of the object relying upon the thus determined corresponding points. Further, an occluded region which contains no corresponding point is detected and is removed, in order to further improve the precision for measuring the position.


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