The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 1989
Filed:
Mar. 15, 1988
Applicant:
Inventor:
Keiji Satoh, Tokyo, JP;
Assignee:
Fuji Jukogyo Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73783 ;
Abstract
An endless metal carrier is bent and treated by a heat treatment process to provide residual stress. The product carrier is cut at a portion, and the radius of the cut carrier in the free state is compared with a standard radius of a standard carrier having a predetermined residual stress to determine whether the radius coincides with the standard radius.
Satoh, Keiji. (1989). Method of measuring residual stress in a carrier produced in (U.S. Patent No. 4823608). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4823608
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile