The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 1989
Filed:
Jul. 22, 1987
Miha Fuderer, Eindhoven, NL;
Johannes J Cuppen, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
Phase error contributions in pixels of a complex image of a nuclear magnetization distribution in a body region due to inhomogeneities of the steady, uniform magnetic field which are caused by the magnetic susceptibility of, for example a patient to be examined and by eddy currents are eliminated by processing the resonance signals obtained in multiple cycles of different magnetic field characteristics according to the assumption that the phase error varies smoothly as a function of the location in the complex image. A corrected phase and the corresponding phase error of a given pixel are determined and then the corrected errors of the next adjacent pixels are sequentially determined and a corrected phase 0 or .+-..pi. assigned to the respective next adjacent pixel, if the phase difference between its phase and the known phase error of the preceding pixel is modulo 2.pi. in intervals (-.DELTA.,.DELTA.), (.+-..pi.-.DELTA.,.+-..pi.+.DELTA.) representing the maximum phase error difference between the adjacent pixels, where the phase error of the next pixel is the difference between its non-corrected and its corrected phase decreased or increased by .eta.2.pi. as to be minimized with respect to the phase error of the preceding adjacent pixel. This enables elimination of the phase error by only a single scan of the body itself.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile