The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 1989

Filed:

Apr. 04, 1988
Applicant:
Inventor:

Taizo Saito, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ; G02B / ;
U.S. Cl.
CPC ...
250235 ; 250236 ; 350-68 ; 346108 ;
Abstract

In a deflection scanning optical system, a single first mirror is arranged between a laser beam source and a surface to be scanned. The first mirror has a first reflecting section, a second reflecting section and a transparent section. The laser beam from the laser beam source is reflected by the first reflecting section. A second mirror is provided for reflecting the laser beam reflected by the first reflecting section, toward the second reflecting section. The second mirror also reflects the laser beam reflected by the first reflecting section to transmit the reflected laser beam through the transparent section, thereby directing the transmitted laser beam toward the surface to be scanned. A detector received the laser beam reflected by the second mirror toward the second reflecting section and reflected by the same, for detecting a scanning position of the laser beam with respect to the surface to be scanned.


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