The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 1989

Filed:

Aug. 17, 1987
Applicant:
Inventors:

Hiroshi Kobayashi, Kodaira-shi, Tokyo, JP;

Haruhiko Machida, Shinjuki-ku, Tokyo, JP;

Hideaki Ema, Shizuoka, JP;

Jun Akedo, Tokyo, JP;

Assignees:

Ricoh Company, Ltd., Tokyo, JP;

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D / ;
U.S. Cl.
CPC ...
2502 / ; 2502 / ;
Abstract

An object to be measured for the amount of movement thereof has a uniformly periodic structure. The object is illuminated with divergent light emitted from a coherent spot light source. By positionally adjusting the spot light source, the object, and a light sensor, an enlarged shadow-picture-like diffraction pattern of the uniformly periodic structure is generated at a position in which the light sensor is disposed. The shadow-picture-like diffraction pattern is moved when the object is moved across the divergent light from the spot light source. The amount of movement of the shadow-picture-like diffraction pattern is detected by the light sensor for thereby measuring the amount of movement of the object.


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