The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 1989
Filed:
Aug. 27, 1987
Robert W Richardson, New York, NY (US);
Barbara M Feldman, Providence, RI (US);
Other;
Abstract
A device for detecting localized retinal damage derives focal responses of the retina from the global response of the retina to patterned stimuli in one's visual field. The stimuli comprises a series of patterns which spatially vary according to a function of a family of orthogonal functions. Each pattern also varies temporally either by being flashed before the patient or by being reversed in contrast at a fixed frequency. An electroretinogram (ERG) or magnetoretinogram (MRG) response of the patient's eye to the series of patterns is fed back into a computer generating the patterns. The responses are used by the computer to determine the coefficients of the transform of the function of the retinal response. The computer calculates the inverse transform associated with the orthogonal functions and provides the retinal response as a function of position on the retina. Contrast, intensity and temporal frequency of the patterns are chosen for a linear response of the eye. Color, intensity and temporal frequency may also be chosen to test different retinal functions. A lock-in amplifier provides the computer the signal amplitude and phase lag of the responses. A signal averager provides the computer an improved signal to noise ratio of the responses.