The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 1989
Filed:
Jun. 16, 1988
Peter Gernhart, Klingenberg, DE;
Gerhart Hintz, Rossdorf, DE;
Guenter Keller, Modautal, DE;
Andreas Pohl, Klein Umstadt, DE;
Carl Schenck AG, Darmstadt, DE;
Abstract
In a test sample clamping apparatus for testing machines, having a clamping head or chuck and a force sensor (2) arranged on the chuck, testing forces are measured with a force sensor and displacements or test sample deformations are measured simultaneously with a light deflection. Thus, rapid test procedures such as fast tensile rupture tests are made possible. The clamping head or chuck includes a base plate (3), one side of which receives or holds clamping elements (15) and the other side of which clamps down the force sensor (2) against a support. A mirror surface (8, 8') is arranged on the base plate (3) or on other appropriate surfaces of the clamping head so as to reflect a ligth beam (10) emitted by a light source (9) onto a position detector (11). In order to measure a deformation caused displacement of the clamping head and correspondingly of the test sample (4), an electronic evaluating circuit (12) evaluates the position dependent output signal of the detector (11).